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Bacterium Cobalt Pores Iron Water NanoLithography self_assembly Cell BismuthVanadate Defect BTO Lateral KAIST amplitude_modulation DiffractiveOpticalElements Writing KPFM flakes CHRYSALIS_INC HiVacuum FailureAnlaysis Nickel #EC LateralPFM AIN Polyaniline Copper CrystalGrowing mechanical property Phthalocyanine ElectroChemical mono_layer Melt Growing HfO2
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NiFe
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.2μm×1.2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Lift height: 20nm