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NanoLithography ScanningKelvinProbeMicroscopy tip_bias_mode Ptfe Indent lift_mode thermal_conductivity Non-ContactMode MolybdenumDisulfide MagneticForceMicroscopy alkanes Pore KevlarFiber ScanningSpreadingResistanceMicroscopy AM_SKPM silicon_oxide AlkaneFilm Ucl BiasMode Moire Potential ForceVolume Roughness Defects HiVacuum high_resolution INSPParis ConductingPolymer Mechanical Polyvinylidene_fluoride layers Vacuum DataStorage nanomechanical SurfaceChange