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MolybdenumDisulfide InsulatorFilm Growth Polyethylene NUS_NNI_Nanocore Ptfe vertical_PFM ULCA VerticalPFM Conductive AFM Conductance AIN AtomicLayer hard_disk_media ContactMode Nanotechnology WS2 Optoelectonics Ca10(PO4)6(OH)2 FAFailureAnlaysis MeltingPoint Zagreb solar_cell Patterns AM_SKPM Hexylthiophene PDMS Pores Perovskite Cell DOE Blood CopperFoil Litho Ram
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Polymer patterns on Si (1/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=1N/m, f=90kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.2Hz
- Pixel: 512×256