-
small_scan SICM Hair single_layer hetero_structure Growth ferromagnetic OpticalWaveguides tip_bias_mode Tungsten align Insulator frequency_modulation BTO Polyvinylidene_fluoride IIT-chennai Temperature SiliconCrystal Hexacontane plastic Mfm Reduction plastics BFO BlockCopolymer FAFailureAnlaysis Fujian Chrome exfoliate EFM TemperatureControllerStage Composition Molybdenum_disulfide ContactModeDot Vacuum
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126