-
WWafer SICM BiasMode PS_LDPE gallium_nitride OrganicSemiconductor FloppyDisk Ceramic ULCA Sphere MultiferroicMaterials optoelectronics GranadaUniv Biofilm layers Sulfur FrictionForce Chemical_Vapor_Deposition Microchannel ScanningTunnelingMicroscopy Polymer ThinFilm FFM molecular_self_assembly STO CrossSection Device MetalCompound Electrode CuSubstrate TemperatureControllerStage SetpointMode NanoLithography LFM Inorganic
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Galfenol (Alloy of iron and gallium)
Scanning Conditions
- System: XE15
- Scan Mode: MFM
- Cantilever: MFMR (k=2.8N/m, f=70kHz)
- Scan Size: 40μm×40μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- MFM Lift height: 50nm