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Zhi Ito Electronics Heat Crystal Pzt EvatecAG light_emission Strontium PiezoelectricForceMicroscopy temp Scanning_Thermal_Microscopy PvdfFilm WS2 conductive hard_disk_media Solution FloppyDisk LateralForceMicroscopy CopperFoil Growing ChemicalCompound DomainSwitching MolecularSelfAssembly Gong Treatment phase_change CastIron Stiffness HACrystal Friction WWafer Pinpoint Self-assembledMonolayer Defects
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Graphene_hBN Moiré Pattern
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 500nm×500nm,
- Scan Rate: 2Hz, 4Hz
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 500nm×500nm,
- Scan Rate: 2Hz, 4Hz
- Pixel: 256 × 256