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Granada CntFilm self_healing P3HT HiVacuum Conductivity Change temp_control I-VSpectroscopy MagneticArray Pores 2d_materials HighAcpectRatio Au111 PANI Morphology Mfm HOPG PhaseImaging Tape membrane China KelvinProbeForceMicroscopy FailureAnalysis TappingMode ThermalConductivity ScratchMode AIN Conducting pulsed_laser_deposition BiVO4 SKKU Hole Domain organic_polymer
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V